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Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits

dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorCreten, Ybe
dc.contributor.authorMerken, Patrick
dc.contributor.authorPutzeys, Jan
dc.contributor.authorDe Moor, Piet
dc.contributor.authorClaeys, Cor
dc.contributor.authorMohammazadeh, H.
dc.contributor.authorNickson, R.
dc.date.accessioned2021-10-15T16:16:43Z
dc.date.available2021-10-15T16:16:43Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9604
dc.sourceIIOimport
dc.titleImpact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorPutzeys, Jan
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecPutzeys, Jan::0000-0001-8834-5852
dc.source.peerreviewno
dc.source.beginpage369
dc.source.endpage375
dc.source.conferenceProceedings 7th European Conference on Radiation and its Effects on Components and Systems
dc.source.conferencedate15/09/2003
dc.source.conferencelocationNoordwijk The Netherlands
imec.availabilityPublished - imec
imec.internalnotesESA SP-536


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