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Performance degradation of an LC-tank VCO by impact of digital switching noise

dc.contributor.authorSoens, Charlotte
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorWambacq, Piet
dc.contributor.authorDonnay, Stephane
dc.date.accessioned2021-10-15T16:20:36Z
dc.date.available2021-10-15T16:20:36Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9617
dc.sourceIIOimport
dc.titlePerformance degradation of an LC-tank VCO by impact of digital switching noise
dc.typeProceedings paper
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage119
dc.source.endpage122
dc.source.conferenceProceedings of the 30th European Solid-State Circuits Conference - ESSCIRC
dc.source.conferencedate21/09/2004
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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