Device performance of 90nm nMOSFETs at liquid nitrogen temperature

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Authors
Takakura, K.; Hayama, K.; Ohyama, H.; Mercha, Abdelkarim; Lee, Shih-Chung; Simoen, Eddy; Claeys, Cor
Conference
Proceedings WOLTE-6 - 6th European Workshop on Low Temperature Electronics
Title
Device performance of 90nm nMOSFETs at liquid nitrogen temperature
Publication type
Proceedings paper
Embargo date
9999-12-31
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