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ESD protection for a 5.5 GHz LNA in 90 nm RF CMOS implementation concepts, constraints and solutions

dc.contributor.authorThijs, Steven
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorDaenen, Tom
dc.contributor.authorScholten, A.
dc.contributor.authorDegraeve, Robin
dc.contributor.authorWambacq, Piet
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T16:36:50Z
dc.date.available2021-10-15T16:36:50Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9671
dc.sourceIIOimport
dc.titleESD protection for a 5.5 GHz LNA in 90 nm RF CMOS implementation concepts, constraints and solutions
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorDaenen, Tom
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.source.peerreviewno
dc.source.beginpage1.B.2
dc.source.conferenceElectrical Overstress / Electrostatic Discharge Symposium Proceedings
dc.source.conferencedate19/09/2004
dc.source.conferencelocationDallas, TX USA
imec.availabilityPublished - imec
imec.internalnotesBest paper award. CD-ROM proceedings


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