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dc.contributor.authorUlyashin, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCarnel, Lodewijk
dc.contributor.authorDe Wolf, Stefaan
dc.contributor.authorDekkers, Harold
dc.contributor.authorRafi, J.M.
dc.contributor.authorBeaucarne, Guy
dc.contributor.authorPoortmans, Jef
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T16:46:07Z
dc.date.available2021-10-15T16:46:07Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9700
dc.sourceIIOimport
dc.titleEffective lifetime of minority carriers in silicon: the role of heat- and hydrogen plasma treatments
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage334
dc.source.endpage345
dc.source.conferenceHigh Purity Silicon VIII
dc.source.conferencedate4/10/2004
dc.source.conferencelocationHonolulu, HI Hawaii
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. PV 2004-05


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