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High-level simulation of substrate noise in high-ohmic substrates with interconnect and supply effects

dc.contributor.authorVan der Plas, Geert
dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorWambacq, Piet
dc.contributor.authorDonnay, Stephane
dc.contributor.authorGielen, Georges
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-10-15T16:55:31Z
dc.date.available2021-10-15T16:55:31Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9731
dc.sourceIIOimport
dc.titleHigh-level simulation of substrate noise in high-ohmic substrates with interconnect and supply effects
dc.typeProceedings paper
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage854
dc.source.endpage859
dc.source.conferenceProceedings 41st Design Automation Conference - DAC
dc.source.conferencedate7/06/2004
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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