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Impact of oxygen related extended defects on silicon diode characteristics
Publication:
Impact of oxygen related extended defects on silicon diode characteristics
Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Simoen, Eddy
;
Kaniava, Arvydas
;
Libezny, Milan
;
Claeys, C.
Journal
J. Appl. Phys.
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1976
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations
Metrics
Views
1976
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations