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Impact of oxygen related extended defects on silicon diode characteristics

dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorLibezny, Milan
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T13:22:31Z
dc.date.available2021-09-29T13:22:31Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/977
dc.sourceIIOimport
dc.titleImpact of oxygen related extended defects on silicon diode characteristics
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage5669
dc.source.endpage76
dc.source.journalJ. Appl. Phys.
dc.source.issue11
dc.source.volume77
imec.availabilityPublished - imec


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