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Characterization and failure analysis of MEMS: high resolution optical investigation of small out-of-plane movements and fast vibrations
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Authors
van Spengen, Merlijn
;
Puers, Bob
;
Mertens, Robert
;
De Wolf, Ingrid
Issue
2
Journal
Microsystems Technologies
Volume
10
Title
Characterization and failure analysis of MEMS: high resolution optical investigation of small out-of-plane movements and fast vibrations
Publication type
Journal article
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