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Noise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology

dc.contributor.authorVandersmissen, Raf
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorDambrine, G.
dc.contributor.authorCarchon, Geert
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-15T17:21:45Z
dc.date.available2021-10-15T17:21:45Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9815
dc.sourceIIOimport
dc.titleNoise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology
dc.typeOral presentation
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorBorghs, Gustaaf
dc.source.peerreviewno
dc.source.conferenceInternational Conference on GaAs Manufacturing Technology - GaAsMANTECH
dc.source.conferencedate3/05/2004
dc.source.conferencelocationMiami Beach, FL USA
imec.availabilityPublished - imec


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