dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Pintelon, Rik | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Donnay, Stephane | |
dc.date.accessioned | 2021-10-15T17:22:40Z | |
dc.date.available | 2021-10-15T17:22:40Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9818 | |
dc.source | IIOimport | |
dc.title | Extended subspace identification of improper linear systems | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Donnay, Stephane | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Donnay, Stephane::0000-0003-2489-4793 | |
dc.source.peerreview | no | |
dc.source.beginpage | 454 | |
dc.source.endpage | 459 | |
dc.source.conference | Proceedings Design, Automation and Test in Europe Conference and Exhibition | |
dc.source.conferencedate | 16/02/2004 | |
dc.source.conferencelocation | Paris France | |
imec.availability | Published - imec | |