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Low frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETs

dc.contributor.authorVasina, Petr
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorSikula, J.
dc.date.accessioned2021-09-29T13:23:18Z
dc.date.available2021-09-29T13:23:18Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/983
dc.sourceIIOimport
dc.titleLow frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage167
dc.source.endpage171
dc.source.conferenceNoise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop
dc.source.conferencedate18/07/2005
dc.source.conferencelocationBrno Czech Republic
imec.availabilityPublished - open access


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