Show simple item record

Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies

dc.contributor.authorVassilev, Vesselin
dc.contributor.authorLorenzini, Martino
dc.contributor.authorJansen, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorThijs, Steven
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorSteyaert, M.
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-15T17:30:26Z
dc.date.available2021-10-15T17:30:26Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9842
dc.sourceIIOimport
dc.titleAdvanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.beginpage2.B.1
dc.source.conferenceElectrical Overstress / Electrostatic Discharge Symposium Proceedings
dc.source.conferencedate19/09/2004
dc.source.conferencelocationDallas, TX USA
imec.availabilityPublished - imec
imec.internalnotesCD-ROM proceedings


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record