Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
Publication:
Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
Copy permalink
Date
2004
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vassilev, Vesselin
;
Lorenzini, Martino
;
Jansen, Philippe
;
Groeseneken, Guido
;
Thijs, Steven
;
Mahadeva Iyer, Natarajan
;
Steyaert, M.
;
Maes, Herman
Journal
Abstract
Description
Metrics
Views
2058
since deposited on 2021-10-15
Acq. date: 2026-01-09
Citations
Metrics
Views
2058
since deposited on 2021-10-15
Acq. date: 2026-01-09
Citations