Publication:
Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
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2060 since deposited on 2021-10-15
2last month
Acq. date: 2026-04-06
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Views
2060 since deposited on 2021-10-15
2last month
Acq. date: 2026-04-06
Citations