Publication:

Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies

Date

2004
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorLorenzini, Martino
dc.contributor.authorJansen, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorThijs, Steven
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorSteyaert, M.
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.accessioned2021-10-15T17:30:26Z
dc.date.available2021-10-15T17:30:26Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9842
dc.source.beginpage2.B.1
dc.source.conferenceElectrical Overstress / Electrostatic Discharge Symposium Proceedings
dc.source.conferencedate19/09/2004
dc.source.conferencelocationDallas, TX USA
dc.title

Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions