Show simple item record

Analysis of irradiation induced defects in silicon devices

dc.contributor.authorVegh, Gerzson
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T13:23:34Z
dc.date.available2021-09-29T13:23:34Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/985
dc.sourceIIOimport
dc.titleAnalysis of irradiation induced defects in silicon devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage329
dc.source.endpage34
dc.source.conferenceRELECTRONIC '95. 9th Symposium on Quality and Reliability in Electronics; 16-18 Oct. 1995; Budapest, Hungary.
dc.source.conferencelocation
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record