Selection of ferroelectric/high-k gate stack combination for optimized FeFET performance

Thumbnail
Metadata
Show full item record
Authors
Xu, Zhen; Viapiana, Matteo; Kaczer, Ben; Goux, Ludovic; Groeseneken, Guido; Wouters, Dirk
Conference
MRS Fall Meeting Symposium D: Materials and Processes for Nonvolatile Memories
Title
Selection of ferroelectric/high-k gate stack combination for optimized FeFET performance
Publication type
Oral presentation
Collections