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Microscopy of individual doping atoms in III/V semiconductors by Scanning Tunneling Microscopy

dc.contributor.authorYakunin, A.M.
dc.contributor.authorSilov, A.Y.
dc.contributor.authorKoenraad, P.M.
dc.contributor.authorWolter, J.H.
dc.contributor.authorVan Roy, Wim
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorTang, J.M.
dc.contributor.authorFlatté, M.E.
dc.date.accessioned2021-10-15T18:07:44Z
dc.date.available2021-10-15T18:07:44Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9955
dc.sourceIIOimport
dc.titleMicroscopy of individual doping atoms in III/V semiconductors by Scanning Tunneling Microscopy
dc.typeOral presentation
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.source.peerreviewno
dc.source.conference33rd International Shool on the Physics of Semiconducting Compounds
dc.source.conferencedate30/05/2004
dc.source.conferencelocationJaszowiec Poland
imec.availabilityPublished - imec


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