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Surface and grain boundary scattering studied in beveled polycrystalline thin copper films
Publication:
Surface and grain boundary scattering studied in beveled polycrystalline thin copper films
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Brongersma, Sywert
;
Clarysse, Trudo
;
Terzieva, Valentina
;
Rosseel, Erik
;
Vandervorst, Wilfried
;
Maex, Karen
Journal
Journal of Vacuum Science and Technology B
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1871
since deposited on 2021-10-15
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Acq. date: 2025-12-16
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Metrics
Views
1871
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-16
Citations