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Browsing by Author "Abou-Khalil, M."

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    Calculation of the HF characteristics in high electron mobility transistors by considering capture and escape phenomena in the Monte Carlo technique

    Abou-Khalil, M.
    ;
    Schreurs, Dominique  
    ;
    Matsui, T.
    ;
    Wu, K.
    Proceedings paper
    1997, Asia-Pacific Microwave Conference - APMC, 2/12/1997, p.697-700
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    Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors

    Abou-Khalil, M.
    ;
    Schreurs, Dominique  
    ;
    Nauwelaers, Bart  
    ;
    Van Rossum, Marc
    ;
    Maciejko, R.
    Journal article
    1997, Journal of Applied Physics, (82) 12, p.6312-18

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