Browsing by Author "Abou-Khalil, M."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Calculation of the HF characteristics in high electron mobility transistors by considering capture and escape phenomena in the Monte Carlo technique
Proceedings paper1997, Asia-Pacific Microwave Conference - APMC, 2/12/1997, p.697-700Publication Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors
Journal article1997, Journal of Applied Physics, (82) 12, p.6312-18