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Calculation of the HF characteristics in high electron mobility transistors by considering capture and escape phenomena in the Monte Carlo technique
Publication:
Calculation of the HF characteristics in high electron mobility transistors by considering capture and escape phenomena in the Monte Carlo technique
Date
1997
Proceedings Paper
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1662.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Abou-Khalil, M.
;
Schreurs, Dominique
;
Matsui, T.
;
Wu, K.
Journal
Abstract
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1968
since deposited on 2021-09-30
Acq. date: 2025-10-25
Citations
Metrics
Views
1968
since deposited on 2021-09-30
Acq. date: 2025-10-25
Citations