Browsing by Author "Acurio, Eliana"

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A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

Trojman, Lionel
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Acurio, Eliana
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De Jaeger, Brice
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Posthuma, Niels
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Decoutere, Stefaan
Journal article
2023, SOLID-STATE ELECTRONICS, (210) December, p.Art. 108778
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric

Acurio, Eliana
;
Trojman, Lionel
;
De Jaeger, Brice
;
Bakeroot, Benoit
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Decoutere, Stefaan
Proceedings paper
2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021