Browsing by Author "Acurio Mendez, Eliana"
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Publication Influence of GaN- and Si3N4- passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination
Journal article2019, IEEE Transactions on Electron Devices, (66) 2, p.883-889Publication Reliability assessment of AlGaN/GaN Schottky barrier diodes under ON-state stress
Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.167-171Publication Reliability improvements in AlGaN/GaN Schottky barrier diodes with a gated edge termination
Journal article2018, IEEE Transactions on Electron Devices, (65) 5, p.1765-1770Publication Reliability in GaN-based devices for power applications
Proceedings paper2018, IEEE 3rd Ecuador Technical Chapters Meeting - ETCM, 15/10/2018, p.1-6