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Browsing by Author "Agaiby, Rouzet M. B."

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    Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices

    Agaiby, Rouzet M. B.
    ;
    Olsen, Sarah
    ;
    Eneman, Geert  
    ;
    Simoen, Eddy  
    ;
    Augendre, Emmanuel
    Journal article
    2010, IEEE Electron Device Letters, (31) 5, p.419-421

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