Browsing by Author "Aichinger, T."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication Analytic modeling of the bias temperature instability using capture/emission time maps
Publication Defect creation stimulated by thermally activated hole trapping as the driving force behind negative bias temperature instability in SiO2, SiON, and high-k gate stacks
Proceedings paper2008, IEEE Integrated Reliability Workshop - IRW, 12/10/2008, p.91-95Publication Understanding negative bias temperature instability in the context of hole trapping
Journal article2009, Microelectronic Engineering, (86) 7_9, p.1876-1882