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Browsing by Author "Aksenov, Yuri"

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    Impact of hyper-NA reticle properties on ArF immersion lithography

    Leunissen, Peter
    ;
    Ronse, Kurt  
    ;
    Philipsen, Vicky  
    ;
    Jonckheere, Rik  
    ;
    Aksenov, Yuri
    ;
    Bekaert, Joost  
    Proceedings paper
    2004-12, Proceedings SEMICON Japan, 1/12/2004, p.Jan-15-Jan-21
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    Mask-induced polarization effects at high NA

    Estroff, Andrew
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    Fan, Yongfa
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    Bourov, Anatoly
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    Smith, Bruce
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    Foubert, Philippe  
    ;
    Leunissen, Peter
    Proceedings paper
    2005-03, Optical Microlithography XVIII, 28/02/2005, p.555-566
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    Progress in 193nm immersion lithography at IMEC

    Ronse, Kurt  
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    Vandenberghe, Geert  
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    Hendrickx, Eric  
    ;
    Leunissen, Peter
    ;
    Aksenov, Yuri
    Proceedings paper
    2005-01, EMLC- 21th European Mask and Lithography Conference, 31/01/2005, p.26-29
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    Progress in 193nm immersion lithography at IMEC

    Ronse, Kurt  
    ;
    Vandenberghe, Geert  
    ;
    Hendrickx, Eric  
    ;
    Leunissen, Peter
    ;
    Aksenov, Yuri
    Proceedings paper
    2005, 21st European Mask and Lithography Conference, 31/01/2005, p.6-12

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