Browsing by Author "Alles, M.C."

Now showing 1 - 3 of 3

Efficient reliability testing of emerging memory technologies using multiple radiation sources

Bennet, W.G.
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Hooten, N.C.
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Weeded-Wright, S.
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Schrimpf, R.D.
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Reed, R.A.
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Alles, M.C.
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Zhang, E.X.
Proceedings paper
2014, 23rd Conference on Application of Accelerators in Research and Industry - CAARI, 25/05/2014, p.1-8
Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs

Zhang, E.X.
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Samsel, I.K.
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Hooten, N.C.
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Bennett, W.G.
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Funkhouser, E.D.
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Kai, N.
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Ball, D.R.
Proceedings paper
2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/07/2014, p.PE-4
TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories

Weeden-Wright, S.L.
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Bennett, W.G.
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Hooten, N.C.
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Zhang, E.X.
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McCurdy, M.W.
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Schrimpf, R.D.
Journal article
2014, IEEE Transactions on Nuclear Science, (61) 6, p.2972-2978