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Browsing by Author "Altmann, F."

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    Publication

    Study and characterization of GaN MOS capacitors: Planar vs trench topographies

    Mukherjee, K.
    ;
    De Santi, C.
    ;
    You, Shuzhen  
    ;
    Geens, Karen  
    ;
    Borga, Matteo  
    ;
    Decoutere, Stefaan  
    Journal article
    2022, APPLIED PHYSICS LETTERS, (120) 14, p.143501

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