Browsing by Author "Alvarado, J."
Now showing 1 - 8 of 8
- Results Per Page
- Sort Options
Publication Effect of high-energy neutrons on MuGFETs
Journal article2010, Solid-State Electronics, (54) 2, p.196-204Publication Effect of high-energy neutrons on MuGFETs
Proceedings paper2009, 5th EUROSOI Workshop, 19/01/2009, p.139-140Publication Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Journal article2011, Solid-State Electronics, (59) 1, p.18-24Publication Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Proceedings paper2010, 6th Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 25/01/2010, p.119-120Publication High-energy neutrons effect on strained and non-strained SO MuGFETs and planar MOSFETs
; ; Publication High-energy neutrons effect on strained and non-strained SOI MuGFETs
Oral presentation2010, 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREFPublication Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs
Journal article2010, IEEE Transactions on Nuclear Science, (57) 4, p.1764-1770Publication Total-dose effects caused by high-energy neutrons and g-rays in multiple-gate FETs
Proceedings paper2009, 10th European Conference on Radiation and Its Effects on Components and Systems - RADECS, 14/09/2009