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Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
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Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
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Date
2010
Proceedings Paper
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20065.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kilchytska, Valeria
;
Alvarado, J.
;
Collaert, Nadine
;
Rooyackers, Rita
;
Put, Sofie
;
Claeys, Cor
;
Flandre, Denis
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1929
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Acq. date: 2025-12-11
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Views
1929
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-11
Citations