Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Publication:
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
20065.pdf
62.39 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kilchytska, Valeria
;
Alvarado, J.
;
Collaert, Nadine
;
Rooyackers, Rita
;
Put, Sofie
;
Claeys, Cor
;
Flandre, Denis
Journal
Abstract
Description
Metrics
Views
1928
since deposited on 2021-10-18
411
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1928
since deposited on 2021-10-18
411
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations