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Browsing by Author "Amoroso, S. M."

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    On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects

    Kaczer, Ben  
    ;
    Amoroso, S. M.
    ;
    Hussin, R.
    ;
    Asenov, A.
    ;
    Franco, Jacopo  
    ;
    Weckx, Pieter  
    Proceedings paper
    2016, International Integrated Reliability Workshop - IIRW, 9/10/2016

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