Browsing by Author "Aresu, S."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication Evidence for source-side injection hot carrier effects on lateral DMOS transistors
Proceedings paper2004, Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF, 4/10/2004, p.1621-1624Publication High-resolution SILC measurements of thin SiO2 at ultra low voltages
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1485-1489Publication Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements
Journal article2005, Microelectronic Engineering, 80, p.182-185