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High-resolution SILC measurements of thin SiO2 at ultra low voltages
Publication:
High-resolution SILC measurements of thin SiO2 at ultra low voltages
Date
2002
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aresu, S.
;
De Ceuninck, Ward
;
Dreesen, R.
;
Kroes, K.
;
Andries, E.
;
Manca, Jean
;
De Schepper, Luc
;
Degraeve, Robin
;
Kaczer, Ben
;
D'Olieslaeger, Marc
;
D'Haen, Jan
Journal
Microelectronics Reliability
Abstract
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1935
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
Metrics
Views
1935
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations