Publication:

High-resolution SILC measurements of thin SiO2 at ultra low voltages

Date

2002

Journal article

Simple item page Full metadata Statistics

Files

6492.pdf 547.12 KB

Author(s)

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De Ceuninck, Ward

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De Schepper, Luc

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Degraeve, Robin

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D'Olieslaeger, Marc

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Journal

Microelectronics Reliability

Statistics

1935 since deposited on 2021-10-14

Acq. date: 2026-02-24