Browsing by Author "Asanovski, R."
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Publication Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 3, p.1745-1751Publication New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022