Publication:
Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
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145 since deposited on 2024-02-06
Acq. date: 2025-10-23
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486 since deposited on 2024-02-06
Acq. date: 2025-10-23
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Downloads
145 since deposited on 2024-02-06
Acq. date: 2025-10-23
Views
486 since deposited on 2024-02-06
Acq. date: 2025-10-23
Citations