Publication:

Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis

Date

2024
Journal article
https://doi.org/10.1109/TED.2024.3351598
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dc.contributor.authorAsanovski, R.
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorde Marneffe, Jean-Francois
dc.contributor.authorPalestri, P.
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorKaczer, Ben
dc.contributor.authorSelmi, L.
dc.contributor.authorFranco, Jacopo
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorde Marneffe, Jean-Francois
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.orcidimecArimura, Hiroaki::0000-0002-3138-708X
dc.contributor.orcidimecde Marneffe, Jean-Francois::0000-0001-5178-6670
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.date.accessioned2025-01-13T12:54:16Z
dc.date.available2024-02-06T17:19:43Z
dc.date.available2025-01-13T12:54:16Z
dc.date.embargo2024-01-19
dc.date.issued2024
dc.description.wosFundingTextThis work was supported by the "Universita degli Studi di Modena e Reggio Emilia" through the "Bando giovani ricercatori 2021." The reviewof this article was arranged by Editor J. Mateos.
dc.identifier.doi10.1109/TED.2024.3351598
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43498
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1745
dc.source.endpage1751
dc.source.issue3
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume71
dc.subject.keywordsLOW-FREQUENCY NOISE
dc.title

Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis

dc.typeJournal article
dspace.entity.typePublication
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