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Browsing by Author "Ausloos, M."

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    Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown

    Houssa, Michel  
    ;
    Vandewalle, N.
    ;
    Nigam, Tanya
    ;
    Ausloos, M.
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Proceedings paper
    1998, Technical Digest International Electron Devices Meeting - IEDM, 6/12/1998, p.909-912
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    Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown

    Vandewalle, N.
    ;
    Ausloos, M.
    ;
    Houssa, Michel  
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Journal article
    1999, Appl. Phys. Lett., (74) 11, p.1579-1581
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    Reply to the "Comment on 'Thermal conductivity of YBa2(Cu1-xZnx)(3)O7-delta: Relation between x and delta'"

    Houssa, Michel  
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    Ausloos, M.
    ;
    Cloots, R.
    Journal article
    1999, Physical Review B, (59) 5, p.3914-3915
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    Technology and reliability aspects of ultra-thin silicon dioxide layers

    Heyns, Marc  
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    Nigam, Tanya
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    Degraeve, Robin  
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    Mertens, Paul  
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    Schaekers, Marc  
    ;
    Bearda, Twan
    Oral presentation
    1999, International Symposium on Surface Science for Micro- and Nano-Device Fabrication - ISSS-3
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    Technology and reliability of sub-3nm oxides

    Heyns, Marc  
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    Nigam, Tanya
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    Degraeve, Robin  
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    Mertens, Paul  
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    Schaekers, Marc  
    ;
    De Gendt, Stefan  
    Proceedings paper
    1999, 4th Symposium on Thin Gate Oxides, 22/01/1999, p.1-7
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    Thermal conductivity of unconventional superconductors: a probe of the order parameter symmetry

    Ausloos, M.
    ;
    Houssa, Michel  
    Journal article
    1999, Superconductor Science and Technology, (12) 7, p.R103-R114

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