Publication:

Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1928 since deposited on 2021-09-30
Acq. date: 2025-10-23

Citations

Metrics

Views

1928 since deposited on 2021-09-30
Acq. date: 2025-10-23

Citations