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Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Publication:
Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Date
1998
Proceedings Paper
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2748.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Vandewalle, N.
;
Nigam, Tanya
;
Ausloos, M.
;
Mertens, Paul
;
Heyns, Marc
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1928
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1928
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations