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Browsing by Author "Autran, L."

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    Modelling negative bias temperature instabilities in hole-channel metal-oxide-semiconductor field effect transistors with ultrathin gate oxide layers

    Houssa, Michel  
    ;
    Aoulaiche, Marc
    ;
    Autran, L.
    ;
    Parthasarathy, C.
    ;
    Revil, N.
    ;
    Vincent, E.
    Journal article
    2004, Journal of Applied Physics, (95) 5, p.2786-2791

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