Publication:
Modelling negative bias temperature instabilities in hole-channel metal-oxide-semiconductor field effect transistors with ultrathin gate oxide layers
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1805 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
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Statistics
Views
1805 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
Citations