Browsing by Author "Bühler, R.T."
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Publication Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
Proceedings paper2012, IEEE International SOI Conference, 1/10/2012, p.4.11Publication Biaxial stress simulation and electrical characterization of triple-gate SOI nMOSFETs
Proceedings paper2012, Proceedings of the 27th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2012, p.145-152Publication Fin shape influence on the analog performance of standard and trained MuGFETs
Proceedings paper2010, SOI Conference, 11/10/2010Publication SEG and fin dimensions influence on biaxial stress effectiveness in tri-gate SOI nMOSFETs
Proceedings paper2012, 8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 24/01/2012, p.121-122