Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
Publication:
Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
Date
2012
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
25504.pdf
568.38 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bühler, R.T.
;
Agopian, P.G.D.
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, J.A.
Journal
Abstract
Description
Metrics
Views
1882
since deposited on 2021-10-20
Acq. date: 2025-10-29
Citations
Metrics
Views
1882
since deposited on 2021-10-20
Acq. date: 2025-10-29
Citations