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Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
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Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
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Date
2012
Proceedings Paper
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25504.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bühler, R.T.
;
Agopian, P.G.D.
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, J.A.
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1884
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Acq. date: 2025-12-15
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Metrics
Views
1884
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-15
Citations