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Browsing by Author "Bai, Guobin"

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    Publication

    Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization

    Zhou, Longda
    ;
    Liu, Qianqian
    ;
    Yang, Hong
    ;
    Ji, Zhigang
    ;
    Xu, Hao
    ;
    Wang, Guilei
    ;
    Simoen, Eddy  
    Journal article
    2021, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 9, p.229-235

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