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Browsing by Author "Baier, Ulrich"

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    Dry etch challenges for implantable silicon-based semi-flexible neural probe fabrication

    Tutunjyan, Nina  
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    Andrei, Alexandru  
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    Verbinnen, Greet  
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    Slabbekoorn, John  
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    Eberle, Wolfgang  
    Oral presentation
    2011, 4th International Workshop on Plasma Etch and Strip in Microelectronics - PESM
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    Exploring high aspEct ratio 2μm TSV (25:1)

    Kostermans, Maarten
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    Brouri, Mohand
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    Baier, Ulrich
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    Vertommen, Johan  
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    Pageau, Arnaud
    Proceedings paper
    2011-11, 64th Annual Gaseous Electronics Conference - GEC, 14/11/2011
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    Implementation of an industry compliant, 5×50μm, via-middle TSV technology on 300mm wafers

    Redolfi, Augusto  
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    Velenis, Dimitrios  
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    Thangaraju, Sarasvathi
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    Nolmans, Philip  
    Proceedings paper
    2011-06, IEEE 61st Electronic Components and Technology Conference - ECTC, 31/05/2011, p.1384-1388
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    Patterning challenges of optical waveguides for sensing applications

    Jamieson, Geraldine  
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    Baier, Ulrich
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    Duval, Fabrice  
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    Verheyen, Peter  
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    Absil, Philippe  
    Meeting abstract
    2012, Micro and Nano Engineering Conference - MNE, 16/09/2012

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