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Browsing by Author "Bakeroot, B."

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    Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress

    Millesimo, M.
    ;
    Borga, Matteo  
    ;
    Valentini, L.
    ;
    Bakeroot, B.
    ;
    Posthuma, Niels  
    ;
    Vohra, Anurag  
    Journal article
    2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 10, p.5203-5209

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