Publication:

Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress

Date

2023

Journal article

https://doi.org/10.1109/TED.2023.3304272

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Author(s)

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Posthuma, Niels

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Decoutere, Stefaan

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Tallarico, A. N.

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

996 since deposited on 2023-09-23

2last month

Acq. date: 2025-12-12