Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress

Publication:

2023

Journal article

Author(s)

Millesimo, M.

;

;

Valentini, L.

;

Bakeroot, B.

;

;

;

;

Fiegna, C.

;

Tallarico, A. N.

IEEE TRANSACTIONS ON ELECTRON DEVICES

996 since deposited on 2023-09-23

Acq. date: 2026-02-24