Browsing by Author "Barbato, F."
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Publication ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping
;Canato, E ;Meneghini, M. ;Nardo, A. ;Masin, F. ;Barbato, F. ;Barbato, M.; Banerjee, A.Journal article2019, Microelectronics Reliability, 100, p.113334