Publication:
ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1970 since deposited on 2021-10-27
Acq. date: 2025-12-08
Citations
Metrics
Views
1970 since deposited on 2021-10-27
Acq. date: 2025-12-08
Citations