Browsing by Author "Bauwens, F."
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Publication A comprehensive model for hot carrier degradation in LDMOS transistors
Proceedings paper2007, Proceedings 45th Annual IEEE International Reliability Physics Symposium, 15/04/2007, p.492-497Publication Stress-induced mobility enhancement for integrated power transistors
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.877-880